TABLE 1

Estimates of posterior mean of parameters Embedded Image, Embedded Image, Embedded Image, and Embedded Image from the full-data analysis of grain yield (GY) of 599 wheat lines genotyped with 1279 molecular markers

Parameter
Trait–environmentModelaEmbedded ImagebEmbedded ImageEmbedded ImageEmbedded Image
GY-E1P0.5620.286
M-RKHS0.2720.825
PM-RKHS0.1970.1080.746
M-BL0.55420.389
PM-BL0.4340.14120.747
GY-E2P0.5810.248
M-RKHS0.3940.720
PM-RKHS0.3640.1150.531
M-BL0.57421.994
PM-BL0.5010.11724.927
GY-E3P0.4920.342
M-RKHS0.3170.888
PM-RKHS0.2830.1480.625
M-BL0.66726.924
PM-BL0.4790.23737.423
GY-E4P0.5170.300
M-RKHS0.3300.771
PM-RKHS0.2980.1180.594
M-BL0.61224.725
PM-BL0.4710.16927.503
  • Five models were fitted to each trait (GY) and environment (E1, E2, E3, and E4) combination.

  • a Models were pedigree model (P), molecular marker model using reproducing kernel Hilbert space (M-RKHS) regression, pedigree plus molecular marker model using reproducing kernel Hilbert space regression (PM-RKHS), molecular marker regression model using the Bayesian LASSO (M-BL), and pedigree plus the molecular marker model regression using the Bayesian LASSO (PM-BL). Estimates of posterior standard deviations (across traits and models) ranged from 0.041, 0.028, 0.093, and 2.73 to 0.057, 0.060, 0.132, and 11.73 for Embedded Image, Embedded Image, Embedded Image, and Embedded Image, respectively.

  • b Phenotypes were standardized to a unit variance within environment.