TABLE 1

Estimates of posterior mean of parameters , , , and from the full-data analysis of grain yield (GY) of 599 wheat lines genotyped with 1279 molecular markers

Parameter
Trait–environmentModelab
GY-E1P0.5620.286
M-RKHS0.2720.825
PM-RKHS0.1970.1080.746
M-BL0.55420.389
PM-BL0.4340.14120.747
GY-E2P0.5810.248
M-RKHS0.3940.720
PM-RKHS0.3640.1150.531
M-BL0.57421.994
PM-BL0.5010.11724.927
GY-E3P0.4920.342
M-RKHS0.3170.888
PM-RKHS0.2830.1480.625
M-BL0.66726.924
PM-BL0.4790.23737.423
GY-E4P0.5170.300
M-RKHS0.3300.771
PM-RKHS0.2980.1180.594
M-BL0.61224.725
PM-BL0.4710.16927.503
• Five models were fitted to each trait (GY) and environment (E1, E2, E3, and E4) combination.

• a Models were pedigree model (P), molecular marker model using reproducing kernel Hilbert space (M-RKHS) regression, pedigree plus molecular marker model using reproducing kernel Hilbert space regression (PM-RKHS), molecular marker regression model using the Bayesian LASSO (M-BL), and pedigree plus the molecular marker model regression using the Bayesian LASSO (PM-BL). Estimates of posterior standard deviations (across traits and models) ranged from 0.041, 0.028, 0.093, and 2.73 to 0.057, 0.060, 0.132, and 11.73 for , , , and , respectively.

• b Phenotypes were standardized to a unit variance within environment.